"Impact of DC and RF non-conducting stress on nMOS reliability."

Andrea Cattaneo et al. (2015)

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DOI: 10.1109/IRPS.2015.7112835

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-29

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Andrea Cattaneo, Sandro Pinarello, Jan-Erik Mueller, Robert Weigel:
Impact of DC and RF non-conducting stress on nMOS reliability. IRPS 2015: 4

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