"Single pulse short-circuit robustness and repetitive stress aging of GaN GITs."

Alberto Castellazzi et al. (2018)

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DOI: 10.1109/IRPS.2018.8353593

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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  - https://dblp.org/rec/conf/irps/CastellazziFZOP18
Alberto Castellazzi, Asad Fayyaz, Siwei Zhu, Thorsten Oeder, Martin Pfost:
Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. IRPS 2018: 4

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