"Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm ..."

Jingchen Cao et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129254

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-20

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Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva:
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. IRPS 2020: 1-5

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