"Self-heating-aware CMOS reliability characterization using degradation maps."

Erik Bury et al. (2018)

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DOI: 10.1109/IRPS.2018.8353541

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  - conf/irps/BuryCKCFSWL18
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Erik Bury, Adrian Vaisman Chasin, Ben Kaczer, Kai-Hsin Chuang, Jacopo Franco, Marko Simicic, Pieter Weckx, Dimitri Linten:
Self-heating-aware CMOS reliability characterization using degradation maps. IRPS 2018: 2

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