"Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS."

Alain Bravaix et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129214

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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  - https://dblp.org/rec/conf/irps/BravaixKNFC20
Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho:
Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS. IRPS 2020: 1-8

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