"Non-poissonian behavior of hot carrier degradation induced variability in ..."

Roberta Bottini et al. (2018)

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DOI: 10.1109/IRPS.2018.8353645

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  - conf/irps/BottiniGVVMM18
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Roberta Bottini, Andrea Ghetti, Sara Vigano, Maria Grazia Valentini, Pratap Murali, Chandra Mouli:
Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs. IRPS 2018: 6

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