"On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation Processes ..."

M. Boito et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529407

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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M. Boito, Manuel Fregolent, Carlo De Santi, A. Abbisogni, S. Smerzi, Isabella Rossetto, Ferdinando Iucolano, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation Processes Investigated by a Novel Experimental Approach. IRPS 2024: 1-5

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