"Reliability of CMOS-SOI power amplifiers for millimeter-wave 5G: the case ..."

Peter M. Asbeck et al. (2022)

> Home

Details and statistics

DOI: 10.1109/IRPS48227.2022.9764417

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/AsbeckARJ22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/AsbeckARJ22
Peter M. Asbeck, Sravya Alluri, Narek Rostomyan, Jefy Alex Jayamon:
Reliability of CMOS-SOI power amplifiers for millimeter-wave 5G: the case for pMOS (Invited). IRPS 2022: 4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.