"Impact of forming gas annealing on the degradation dynamics of Ge-based ..."

Fernando L. Aguirre et al. (2018)

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DOI: 10.1109/IRPS.2018.8353663

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-29

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Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, Sivan Fadida, Roy Winter, Moshe Eizenberg:
Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. IRPS 2018: 3-1

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