"SMD Classification for Automated Optical Inspection Machine Using ..."

Dae-ui Lim, Young-Gyu Kim, Tae-Hyoung Park (2019)

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DOI: 10.1109/IRC.2019.00072

access: closed

type: Conference or Workshop Paper

metadata version: 2019-04-03

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Dae-ui Lim, Young-Gyu Kim, Tae-Hyoung Park:
SMD Classification for Automated Optical Inspection Machine Using Convolution Neural Network. IRC 2019: 395-398

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