"Combining Boolean Gates and Branching Programs in One Model can Lead to ..."

Yosi Ben-Asher, Esti Stein, Ramachandran Vaidyanathan (2017)

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DOI: 10.1109/IPDPSW.2017.39

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yosi Ben-Asher, Esti Stein, Ramachandran Vaidyanathan:
Combining Boolean Gates and Branching Programs in One Model can Lead to Faster Circuits. IPDPS Workshops 2017: 184-191

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