"Total Ionizing Dose Effects by alpha irradiation on circuit performance ..."

Takashi Yoshida, Kazutoshi Kobayashi, Jun Furuta (2019)

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DOI: 10.1109/IOLTS.2019.8854439

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-07

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Takashi Yoshida, Kazutoshi Kobayashi, Jun Furuta:
Total Ionizing Dose Effects by alpha irradiation on circuit performance and SEU tolerance in thin BOX FDSOI process. IOLTS 2019: 236-238

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