"Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena."

Franz X. Ruckerbauer, Georg Georgakos (2007)

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DOI: 10.1109/IOLTS.2007.60

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Franz X. Ruckerbauer, Georg Georgakos:
Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena. IOLTS 2007: 203-204

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