"3D integration: Circuit design, test, and reliability challenges."

Nikolaos Minas et al. (2010)

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DOI: 10.1109/IOLTS.2010.5560201

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Nikolaos Minas, Ingrid De Wolf, Erik Jan Marinissen, Michele Stucchi, Herman Oprins, Abdelkarim Mercha, Geert Van der Plas, Dimitrios Velenis, Pol Marchal:
3D integration: Circuit design, test, and reliability challenges. IOLTS 2010: 217

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