"Sequential Circuits Applicable for Detecting Different Types of Faults."

Ilya Levin et al. (2002)

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DOI: 10.1109/OLT.2002.1030182

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iolts/LevinSKO02
Ilya Levin, Vladimir Sinelnikov, Mark G. Karpovsky, Sergey Ostanin:
Sequential Circuits Applicable for Detecting Different Types of Faults. IOLTW 2002: 44-

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