"On-Chip Self-Calibration of RF Circuits Using Specification-Driven ..."

Donghoon Han et al. (2005)

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DOI: 10.1109/IOLTS.2005.50

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111

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