"Stochastic Feed-forward Attention Mechanism for Reliable Defect ..."

Jiyoon Lee et al. (2022)

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DOI: 10.1007/978-3-031-16072-1_11

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-01

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  - conf/intellisys/LeeMKMKK22
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  - https://dblp.org/rec/conf/intellisys/LeeMKMKK22
Jiyoon Lee, Chunghyup Mok, Sanghoon Kim, Seokho Moon, Seo-Yeon Kim, Seoung Bum Kim:
Stochastic Feed-forward Attention Mechanism for Reliable Defect Classification and Interpretation. IntelliSys (1) 2022: 148-158

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