"Robust, Non-Redundant Feature Selection for Yield Analysis in ..."

Éric St.-Pierre, Eugene Tuv (2011)

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DOI: 10.1007/978-3-642-23184-1_16

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Éric St.-Pierre, Eugene Tuv:
Robust, Non-Redundant Feature Selection for Yield Analysis in Semiconductor Manufacturing. ICDM 2011: 204-217

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