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"Extreme Temperature (> 200 °C), Radiation Hard (> 1 Mrad), ..."
Saurabh V. Suryavanshi et al. (2022)
- Saurabh V. Suryavanshi, Greg Yeric, Max Irby, X. M. Henry Huang, Glen Rosendale, Lucian Shifren:
Extreme Temperature (> 200 °C), Radiation Hard (> 1 Mrad), Dense (sub-50 nm CD), Fast (2 ns write pulses), Non-Volatile Memory Technology. IMW 2022: 1-4
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