"Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash ..."

Viktor Markov et al. (2023)

> Home

Details and statistics

DOI: 10.1109/IMW56887.2023.10145950

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/imw2/MarkovFSLJK23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/imw2/MarkovFSLJK23
Viktor Markov, Gilles Festes, Louisa Schneider, Steven Lemke, Serguei Jourba, Alexander Kotov:
Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. IMW 2023: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.