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"Highly Reliable 28nm Embedded Flash Process Development for High-Density ..."

Jaehun Lee et al. (2021)

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DOI: 10.1109/IMW51353.2021.9439602

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-13

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  - conf/imw2/LeeJYJWLLHCSKKK21
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  - https://dblp.org/rec/conf/imw2/LeeJYJWLLHCSKKK21
Jaehun Lee, Youngcheon Jeong, Kyongsik Yeom, Changmin Jeon, Jongsung Woo, Sangjin Lee, Ga-Young Lee, Dong-Hwee Hwang, Yong Seok Chung, Minji Seo, Dong-Hyun Kim, DalHwan Kim, Yongsik Kim, HyunChang Lee, Soomin Cho, MyeongHee Oh, Hyun-Jin Shin, Gun Rae Kim, Sungyoung Yoon, Yong Kyu Lee, Young Ki Hong:
Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. IMW 2021: 1-3

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