"Enhanced reliability and trapping behavior in ferroelectric FETs under ..."

Maximilian Lederer et al. (2024)

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DOI: 10.1109/IMW59701.2024.10536975

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-10

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Maximilian Lederer, Franz Müller, Raik Hoffmann, Ricardo Olivo, Yannick Raffel, Shouzhuo Yang, Sourav De, Roman Potjan, Oliver Ostien, Abdelrahman Altawil, Ayse Sünbül, David Lehninger, Thomas Kämpfe, Konrad Seidel:
Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions. IMW 2024: 1-4

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