"High Speed Generation of Fault Location Data for Logic Circuits."

Akira Nakamura, Junro Nose, Shuzo Yamakawa (1974)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2019-07-26

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Akira Nakamura, Junro Nose, Shuzo Yamakawa:
High Speed Generation of Fault Location Data for Logic Circuits. IFIP Congress 1974: 112-116

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