"Hurdle model with random effects for the study of copper hillocks growth ..."

Guilin Li et al. (2015)

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DOI: 10.1109/IEEM.2015.7385672

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Guilin Li, Royston Tan, Szu Hui Ng, Daniel Chua:
Hurdle model with random effects for the study of copper hillocks growth in integrated circuits manufacturing. IEEM 2015: 376-380

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