"The classification methodology of chip quality using canonical correlation ..."

Ki-Hyun Kim et al. (2015)

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DOI: 10.1109/IEEM.2015.7385673

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-03

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Ki-Hyun Kim, Hyung-Shin Kwon, Hee-Il Hong, Hong-Sun Hwang, Kang-Yong Cho, Gyo-Young Jin:
The classification methodology of chip quality using canonical correlation analysis-based variable selection on chip level data. IEEM 2015: 381-385

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