"Performance Gap Between Valid and Invalid Patents in Six Technology Fields."

Huei-Ru Dong, Dar-Zen Chen, Mu-Hsuan Huang (2019)

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DOI: 10.1109/IEEM44572.2019.8978810

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-04

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Huei-Ru Dong, Dar-Zen Chen, Mu-Hsuan Huang:
Performance Gap Between Valid and Invalid Patents in Six Technology Fields. IEEM 2019: 1058-1061

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