"Integrating Maximum Deviation Method and VIKOR for Evaluating Enterprise ..."

Cheng-Yen Chen (2019)

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DOI: 10.1109/IEEM44572.2019.8978931

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-04

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Cheng-Yen Chen:
Integrating Maximum Deviation Method and VIKOR for Evaluating Enterprise Performance in Semiconductor Industry. IEEM 2019: 310-313

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