"4th IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST ..."

> Home

Details and statistics

DOI: —

access: closed

type: Editorship

metadata version: 2020-08-11

- view
- export record
  dblp key:
  - conf/ieeevast/2009
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ieeevast/2009
4th IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2009, Atlantic City, NJ, USA, October 11-16, 2009, part of VisWeek 2009. IEEE Computer Society 2009, ISBN 978-1-4244-5283-5 [contents]

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.