"A new CMOS stress sensor ratiometric readout for in-plane stress magnitude ..."

Zili Yu et al. (2017)

> Home

Details and statistics

DOI: 10.1109/ICSENS.2017.8234135

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ieeesensors/YuSMB17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ieeesensors/YuSMB17
Zili Yu, Cor Scherjon, Yigit Mahsereci, Joachim N. Burghartz:
A new CMOS stress sensor ratiometric readout for in-plane stress magnitude and angle detection. IEEE SENSORS 2017: 1-3

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.