"Gamma-induced Degradation Analysis of Commercial off-the-shelf Camera Sensors."

Bilal Aslam et al. (2019)

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DOI: 10.1109/SENSORS43011.2019.8956620

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-12

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Bilal Aslam, Sangeet Saha, Zeba Khanam, Xiaojun Zhai, Shoaib Ehsan, Rustam Stolkin, Klaus D. McDonald-Maier:
Gamma-induced Degradation Analysis of Commercial off-the-shelf Camera Sensors. IEEE SENSORS 2019: 1-4

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