"A Study on Shunt Resistor-based Current Measurements for Fast Switching ..."

Thilini Wickramasinghe et al. (2019)

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DOI: 10.1109/IECON.2019.8927490

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  - https://dblp.org/rec/conf/iecon/WickramasingheA19
Thilini Wickramasinghe, Stephane Azzopardi, Bruno Allard, Cyril Buttay, Charles Joubert, Christian Martin, Jean-François Mogniotte, Hervé Morel, Pascal Bevilacqua, Thanh-Long Le:
A Study on Shunt Resistor-based Current Measurements for Fast Switching GaN Devices. IECON 2019: 1573-1578

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