"Accelerated-time and reduced-scale Hardware-In-the-Loop tests of an ..."

Anthony Roy et al. (2019)

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DOI: 10.1109/IECON.2019.8927682

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Anthony Roy, Florian Dupriez-Robin, François Auger, Salvy Bourguet, Quoc Tuan Tran:
Accelerated-time and reduced-scale Hardware-In-the-Loop tests of an islanded microgrid. IECON 2019: 6413-6418

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