"Self-adjustment methodology of a thermal camera for detecting faults in ..."

Juan A. Ramirez-Nunez et al. (2016)

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DOI: 10.1109/IECON.2016.7793158

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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  - https://dblp.org/rec/conf/iecon/Ramirez-NunezMO16
Juan A. Ramirez-Nunez, Luis Alberto Morales-Hernández, Roque Alfredo Osornio-Rios, Jose A. Antonino-Daviu, René de Jesús Romero-Troncoso:
Self-adjustment methodology of a thermal camera for detecting faults in industrial machinery. IECON 2016: 7119-7124

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