"Modeling of the Power Losses due to Coss in SJ MOSFETs Submitted to ZVS: ..."

Angelo Raciti et al. (2018)

> Home

Details and statistics

DOI: 10.1109/IECON.2018.8592683

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iecon/RacitiRSSSSMA18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iecon/RacitiRSSSSMA18
Angelo Raciti, Santi Agatino Rizzo, Nunzio Salerno, Giovanni Susinni, Rosario Scollo, Alfio Scuto, Salvatore Musumeci, Eric Armando:
Modeling of the Power Losses due to Coss in SJ MOSFETs Submitted to ZVS: Identification of the Passive Parameters by a Genetic Algorithm. IECON 2018: 1321-1326

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.