"Separation test method for investigation of current density effects on ..."

Haoze Luo et al. (2017)

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DOI: 10.1109/IECON.2017.8216259

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-29

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  - https://dblp.org/rec/conf/iecon/LuoIBLH17
Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He:
Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules. IECON 2017: 1525-1530

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