"Prognosis of chip-loss failure in high-power IGBT module by self-testing."

Yeke Liu, Dawei Xiang, Yifan Fu (2016)

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DOI: 10.1109/IECON.2016.7793051

access: closed

type: Conference or Workshop Paper

metadata version: 2018-02-26

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Yeke Liu, Dawei Xiang, Yifan Fu:
Prognosis of chip-loss failure in high-power IGBT module by self-testing. IECON 2016: 6836-6840

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