"Behavior Modeling and Analysis of High-Voltage SiC MOSFET Considering ..."

Weiguo Li et al. (2023)

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DOI: 10.1109/IECON51785.2023.10311758

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-25

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Weiguo Li, Yunfei Xu, Qingping Li, Yi Hao, Guoliang Zhao, Haijun Liu:
Behavior Modeling and Analysis of High-Voltage SiC MOSFET Considering Temperature Effect. IECON 2023: 1-7

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