"Simulation and analysis of DC and RF performances degradation of NMOS ..."

Insaf Lahbib et al. (2017)

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DOI: 10.1109/IECON.2017.8217397

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-19

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Insaf Lahbib, Aziz Doukkali, Patrick Martin, Philippe Descamps, Guy Imbert:
Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism. IECON 2017: 7969-7973

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