"Leakage power evaluation of FinFET-based FPGA cluster under threshold ..."

Mohamed Mohie El-Din et al. (2016)

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DOI: 10.1109/IDT.2016.7843029

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-16

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Mohamed Mohie El-Din, Hossam A. H. Fahmy, Yehea Ismail, Noha Gamal, Hassan Mostafa:
Leakage power evaluation of FinFET-based FPGA cluster under threshold voltage variation. IDT 2016: 137-141

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