"SR-TPG: A low transition test pattern generator for test-per-clock and ..."

Abdallatif S. Abu-Issa, Iyad K. Tumar, Wasel T. Ghanem (2015)

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DOI: 10.1109/IDT.2015.7396748

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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Abdallatif S. Abu-Issa, Iyad K. Tumar, Wasel T. Ghanem:
SR-TPG: A low transition test pattern generator for test-per-clock and test-per-scan BIST. IDT 2015: 124-128

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