"Worst-case test vectors generation using genetic algorithms for the ..."

Hamzah A. Abdel-Aziz et al. (2010)

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DOI: 10.1109/IDT.2010.5724421

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-25

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Hamzah A. Abdel-Aziz, Mostafa M. Abdel-Aziz, Amr G. Wassal, Ahmed A. Abou-Auf:
Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures. IDT 2010: 117-121

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