"Diagnostics and assessment of imprint quality using pattern recognition ..."

Svitlana Havenko et al. (2024)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2024-10-31

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Svitlana Havenko, Marta Labetska, Mykola Havenko, Valeriy Zhydetskyy, Volodymyr Lytvynenko:
Diagnostics and assessment of imprint quality using pattern recognition methods and digital photography for image processing. ICyberPhyS 2024: 142-152

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