"Post-press product quality assessment models for the IIoT system."

Bohdan Durnyak et al. (2024)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2024-10-31

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  dblp key:
  - conf/icyberphys/DurnyakSTPS24
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  - https://dblp.org/rec/conf/icyberphys/DurnyakSTPS24
Bohdan Durnyak, Petro Shepita, Lyubov Tupychak, Yurii Petriv, Julia Shepita:
Post-press product quality assessment models for the IIoT system. ICyberPhyS 2024: 73-85

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