"Convolutional Ensembling based Few-Shot Defect Detection Technique."

Soumyajit Karmakar et al. (2022)

> Home

Details and statistics

DOI: 10.1145/3571600.3571607

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icvgip/KarmakarBGS022
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icvgip/KarmakarBGS022
Soumyajit Karmakar, Abeer Banerjee, Prashant Sadashiv Gidde, Sumeet Saurav, Sanjay Singh:
Convolutional Ensembling based Few-Shot Defect Detection Technique. ICVGIP 2022: 6:1-6:7

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.