"Thermoreflectance Spectroscopy Technique: An Advanced Tool for ..."

Dorota Pierscinska et al. (2024)

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DOI: 10.1109/ICTON62926.2024.10647757

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-14

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Dorota Pierscinska, Agata Krzastek, Michal Nagowski, Katarzyna Pieniak, Dominika Niewczas, Artur Broda, Kamil Pierscinski:
Thermoreflectance Spectroscopy Technique: An Advanced Tool for Investigation of Thermal Phenomena in Semiconductor Devices. ICTON 2024: 1-4

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