"A Genetic Testing Framework for Digital Integrated Circuits."

Xiaoming Yu et al. (2002)

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DOI: 10.1109/TAI.2002.1180847

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xiaoming Yu, Alessandro Fin, Franco Fummi, Elizabeth M. Rudnick:
A Genetic Testing Framework for Digital Integrated Circuits. ICTAI 2002: 521-526

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