"Anomalous NMOSFET hot carrier degradation on DRAM."

Faxian Shan et al. (2021)

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DOI: 10.1109/ICTA53157.2021.9661707

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-06

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Faxian Shan, Yang Xiong, Chang-Ching Chen, Haibo Chen, James Cho, Xiong Li, Wenyong Jiang, Jengwei Huang:
Anomalous NMOSFET hot carrier degradation on DRAM. ICTA 2021: 56-57

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