"An Empirical Study on the Use of Defect Prediction for Test Case ..."

David Paterson et al. (2019)

> Home

Details and statistics

DOI: 10.1109/ICST.2019.00041

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icst/PatersonCAKFM19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icst/PatersonCAKFM19
David Paterson, José Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn:
An Empirical Study on the Use of Defect Prediction for Test Case Prioritization. ICST 2019: 346-357

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.