"A Test Architecture for Machine Learning Product."

Yasuharu Nishi et al. (2018)

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DOI: 10.1109/ICSTW.2018.00060

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type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yasuharu Nishi, Satoshi Masuda, Hideto Ogawa, Keiji Uetsuki:
A Test Architecture for Machine Learning Product. ICST Workshops 2018: 273-278

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