"Mutation testing of memory-related operators."

Jay Nanavati et al. (2015)

> Home

Details and statistics

DOI: 10.1109/ICSTW.2015.7107449

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/icst/NanavatiWHJK15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icst/NanavatiWHJK15
Jay Nanavati, Fan Wu, Mark Harman, Yue Jia, Jens Krinke:
Mutation testing of memory-related operators. ICST Workshops 2015: 1-10

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.